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add benchmark for sampling calorimeter

Merged Chao Peng requested to merge sampling_cal into master
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<?xml version="1.0" encoding="UTF-8"?>
 
<lccdd>
 
<info
 
name="topside"
 
title="Time-of-flight Optimized PID Silicon Detector for EIC (TOPSiDE)"
 
author="Whitney R. Armstrong"
 
url=""
 
status="development"
 
version="$Id: 1$">
 
<comment> </comment>
 
</info>
 
 
<define>
 
<include ref="topside/topside_defs.xml" />
 
<include ref="eic/eic_defs.xml" />
 
</define>
 
 
<properties>
 
<matrix name="RINDEX__Vacuum" coldim="2" values="
 
1.0*eV 1.0
 
5.1*eV 1.0
 
"/>
 
<matrix name="RINDEX__Air" coldim="2" values="
 
1.0*eV 1.00029
 
5.1*eV 1.00029
 
"/>
 
<matrix name="RINDEX__Quartz" coldim="2" values="
 
1.0*eV 1.46
 
5.1*eV 1.46
 
"/>
 
<matrix name="RINDEX__N2" coldim="2" values="
 
1.0*eV 1.00033
 
4.0*eV 1.00033
 
5.1*eV 1.00033
 
"/>
 
<matrix name="RINDEX__Pyrex" coldim="2" values="
 
1.0*eV 1.5
 
4.0*eV 1.5
 
5.1*eV 1.5
 
"/>
 
<matrix name= "REFLECTIVITY_mirror" coldim="2" values="
 
1.0*eV 0.9
 
4.0*eV 0.9
 
5.1*eV 0.9
 
"/>
 
</properties>
 
 
<includes>
 
<gdmlFile ref="topside/elements.xml"/>
 
<gdmlFile ref="topside/materials.xml"/>
 
</includes>
 
 
<materials>
 
<material name="AirOptical">
 
<D type="density" unit="g/cm3" value="0.0012"/>
 
<fraction n="0.754" ref="N"/>
 
<fraction n="0.234" ref="O"/>
 
<fraction n="0.012" ref="Ar"/>
 
<property name="RINDEX" ref="RINDEX__Vacuum"/>
 
</material>
 
<material name="N2cherenkov">
 
<D type="density" value="0.00125" unit="g/cm3"/>
 
<composite n="1" ref="N"/>
 
<property name="RINDEX" ref="RINDEX__N2"/>
 
</material>
 
<material name="PyrexGlass">
 
<D type="density" value="2.23" unit="g/cm3"/>
 
<fraction n="0.806" ref="SiliconOxide"/>
 
<fraction n="0.130" ref="BoronOxide"/>
 
<fraction n="0.040" ref="SodiumOxide"/>
 
<fraction n="0.023" ref="AluminumOxide"/>
 
<property name="RINDEX" ref="RINDEX__Pyrex"/>
 
</material>
 
</materials>
 
 
<surfaces>
 
<comment> For the values of "finish", model and type, see TGeoOpticalSurface.h !
 
</comment>
 
<opticalsurface finish="polished" model="glisur" name="MirrorOpticalSurface" type="dielectric_metal" value="0">
 
<property name="REFLECTIVITY" ref="REFLECTIVITY_mirror"/>
 
<property name="RINDEX" coldim="2" values="1.034*eV 1.5 4.136*eV 1.5"/>
 
<!--<property name="EFFICIENCY" ref="EFFICIENCY0x8b77240"/>-->
 
</opticalsurface>
 
<opticalsurface name="mirror2" finish="polished" model="glisur" type="dielectric_dielectric">
 
<property name="REFLECTIVITY" coldim="2" values="1.034*eV 0.8 4.136*eV 0.9"/>
 
<property name="EFFICIENCY" coldim="2" values="2.034*eV 0.8 4.136*eV 1.0"/>
 
<property name="RINDEX" coldim="2" values="1.034*eV 1.5 4.136*eV 1.5"/>
 
</opticalsurface>
 
 
</surfaces>
 
<limits>
 
<limitset name="EICBeamlineLimits">
 
<limit name="step_length_max" particles="*" value="1.0" unit="mm" />
 
<limit name="track_length_max" particles="*" value="1.0" unit="mm" />
 
<limit name="time_max" particles="*" value="0.1" unit="ns" />
 
<limit name="ekin_min" particles="*" value="0.001" unit="MeV" />
 
<limit name="range_min" particles="*" value="0.1" unit="mm" />
 
</limitset>
 
<limitset name="cal_limits">
 
<limit name="step_length_max" particles="*" value="0.1" unit="mm"/>
 
</limitset>
 
</limits>
 
 
<display>
 
<include ref="topside/display.xml" />
 
</display>
 
 
<!--
 
<include ref="topside/vertex_tracker.xml"/>
 
-->
 
<include ref="topside/beampipe.xml"/>
 
<include ref="topside/silicon_tracker.xml"/>
 
<!--<include ref="topside/ecal.xml"/>--> <comment> old version of em barrel - SiW sampling design </comment>
 
<include ref="topside/ecal_wAstroPixSiW.xml"/> <comment> new version of em barrel - SiW AstroPix sampling design </comment>
 
<!--
 
<include ref="topside/hcal.xml"/>
 
<include ref="topside/forward_rich.xml"/>
 
<include ref="topside/solenoid.xml"/>
 
<include ref="topside/roman_pots.xml"/>
 
<include ref="eic/forward_ion_beamline.xml"/>
 
-->
 
 
<detectors>
 
</detectors>
 
<readouts>
 
</readouts>
 
 
 
</lccdd>
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